Abstract
Photoinduced discharge characteristics of the photoreceptors consisting of a poly-n-vinylcarbazole (PVK) layer sensitized with a thin carrier-generation layer have been analyzed theoretically. The electric field in the PVK layer has been calculated by solving the three basic equations: the law of hole conduction with neglect of diffusion, the continuity equation with no trap, and Poisson's equation. After long time from light-on, the surface voltage is determined by the hole charges drifting in the PVK layer; it decreases with time t as (3/4)(tT0/t)1/3, where tT0 is the hole transit time across the PVK layer at the initial electric field. The theory has been compared with measurements on the photoreceptors in which the carrier-generation layer consists of amorphous Se or amorphous Se0.86Te0.14. The hole mobility in the PVK layer has been estimated to be 10−5 cm2/V sec at an electric field of 106 V/cm. When illuminated with a tungsten light, the Se0.86Te0.14-PVK photoreceptors have shown an emission-limited discharge current which is nearly proportional to the surface voltage and is 4 times as large as that of the Se-PVK photoreceptors at 106 V/cm.
Published Version
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