Abstract
A method for X-ray fluorescence determination of trace amounts of Pb(II), Cd(II) and Hg(II) ions (up to 250 μg/ml) directly in the sorbent phase after their extraction from solutions in a dynamic sorption mode has been developed. Merck silica gel (particle d 0.1-0.2 mm, specific surface 428.61 m2/g), chemically modified with 4-(2-pyridylazo)-resorcinol functional groups in one step, was used as a sorbent. An energy dispersive X-ray fluorescence analyzer with a semiconductor detector "ElvaX" ("Elvatex", Kyiv) was used in the study.
 It was found that the combined analysis of micro quantities of Pb, Cd and Hg by sorption-x-ray fluorescence method after their preconcentration on silica gel with chemically fixed surfactant requires the use of calibration curves for each metal, taking into account the presence of other ions in solutions.
 The developed by us method of sorption-x-ray fluorescence determination of micro quantities of Pb(II), Cd(II) and Hg(II) after their extraction and preconcentration on silica gel with chemically fixed 4-(2-pyridylazo)-resorcinol can be effectively used for the analysis of natural and man-made objects of complex chemical composition.
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