Some transport coefficients of multilayer metallic film

Abstract

This paper deals with a derivation of some transport coefficients of multilayer metallic film. The derivation is performed on the basis of Fuchs–Sondheimer theory in which the electrical conductivity of thin metallic films is strongly affected by a surface scattering process. The multilayer metallic film consists of alternating layers of two different metals. The scattering of conduction electrons at the interfaces between the layers are described by the Fuchs specularity reflection parameter P and the refractive parameter Q. The latter parameter corresponds to the fraction of conduction electrons refracted at the interfaces. However, the background mechanism of the scattering of conduction electrons in the layers are described by two different relaxation times, which are assumed to be functions of energy. Numerical results are obtained for parameters characteristic of alternating layers of silver and gold.