Abstract
On the basis of an experimental study of the effect of ion absorption on the electrical conduction in thin metallic films, a theory is developed to explain current noise in metal films with a granular structure. According to these experiments, trapping of electrons in the substrate surface modulates the transmission coefficient of electrons in the intergrain tunnelling process which is responsible for the electric conduction in these films. The power spectrum of the noise is calculated and compared with the experimental results.
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