Abstract
Cadmium sulfide thin films have been deposited by a simple and inexpensive successive ionic layer adsorption and reaction (SILAR) method from aqueous as well as non-aqueous media. The CdS films have been characterized by X-ray diffraction (XRD), scanning electron microcopy (SEM), transmission electron microscopy (TEM), energy dispersive X-ray analyses (EDAX) and Rutherford back scattering (RBS). X-ray studies showed the hexagonal crystal structure of CdS films. The surface morphology is found to be smooth and dense from SEM images for both the films. High resolution TEM (HRTEM) showed that the films consist of nanoparticles. The EDAX and RBS studies showed stoichiometric formation of CdS from both the media. Inclusion of oxygen is observed from RBS studies.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
