Abstract
Stoichiometric and offstoichiometric zinc telluride thin films are prepared by flash evaporation onto glass substrate at 50° C. The films are investigated by transmission electron microscopy, electron diffraction (for selected area diffraction and micro area diffraction) and IR transmittance. The electrical resistivity and its temperature dependence were studied by sandwiching the zinc telluride film between silver electrodes making ohmic contacts. The degradation in structure has been observed on disturbing the stoichiometry of zinc telluride films. Interestingly, the composition dependence of electrical resistivity of the films agrees well with the IR transmission spectra.
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