Abstract
ABSTRACTNanoisland films have been grown via incongruent evaporation films. The basis of incongruent evaporation growth method was worked out. Samples surface morphology has been studied by atomic force microscopy. The surface density and characteristic dimensions of the islands have been shown.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
