Abstract
The theory behind fluorescent X‐ray spectroscopy is briefly reviewed. X‐ray spectrometers are designed for the rapid qualitative and quantitative analysis of elements having an atomic number greater than 22 (titanium). This technique has been used to determine quantitatively the nickel plated out in nickel pickling and the amounts of cobalt and nickel deposited on the base metal during the firing of enamel ground coats. The method has been used to determine the lead content of a glaze frit. The X‐ray spectrometer can be used satisfactorily for the analysis of specific elements, above titanium in atomic number, in virtually any raw material. For example, iron in pyrophyllite and niobium in titania have been determined quantitatively. The advantages and disadvantages of this technique are discussed.
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