Abstract
Soft x-ray emission(SXE) studies of several semiconductors and early transition metal compounds have been carried out. In the case of transition metal compounds, the comparison between photoemission(PES) and SXE spectra shows that the fluorescence spectra are consistent with PES spectra, but the elastic- and inelastic-light scattering spectra reflects the initial 3d states which may be related with the charge transfer state. On the other hand, the inelastic-light(Raman) scattering spectra of semiconductors have been measured in the energy region corresponding to the core exciton states. The Raman scattering spectra whose energy shifts in proportion to the excitation energy are found in the excitation energy region below the absorption edge. It is found that the Raman scattering of semiconductor emits the valence exciton as an elementary excitation.
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