Abstract
Abstract Soft X-ray emission and absorption (SXEA) spectroscopy is presented as a possible method for electronic structure analysis. To demonstrate its feasibility, the electronic structure of silicon backbones in a cubic silicon cluster (octasilacubane) and its related clusters was analyzed by measuring the SXEA spectra in the Si K-shell threshold. Three discrete levels are observed in both Si3p occupied and unoccupied orbitals of octasilacubane, which may be caused by the large degree of degeneracy of the orbitals due to the high symmetry of the cubic silicon backbone structure. The measured narrow energy gap of 2.3 eV between the highest occupied and the lowest unoccupied orbitals of octasilacubane shows that Si3p σ-electrons in octasilacubane are more widely conjugated than those in the related clusters.
Published Version
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