Abstract
Oxygen K-shell x-ray fluorescence was monitored from the MgO substrate of a metallic heterostructure system containing a buried SmCo permanent magnet layer. This fluorescence was utilized as a detector to record transmission yield spectra for the SmCo film at both the Co–L3,2 and Sm–M5,4 absorption edges. Ordinarily, traditional transmission yield spectroscopy in the soft x-ray regime is impossible to perform with films on single-crystal substrates. The measured intensity ratios agree with simulations to confirm the thickness information. The potential and limitations of this technique are discussed in comparison to standard total electron and fluorescence yield techniques and magnetic circular dichroism.
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