Abstract
This paper proposes a novel method for the assessment of circuit reliability, termed SNaP. Since it combines the properties of both simulation-based and analytical solutions, the proposed method is considered hybrid. Furthermore, it has the ability to deal with the occurrence of multiple faults while taking logic masking into account. As opposed to other reliability methods found in the literature, the proposed method has a linear complexity with the number of gates, which allows for the evaluation of complex circuits. The results presented are in good agreement with other methods in the literature.
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