Abstract

III-nitride membranes offer promising perspectives and improved device designs in photonics, electronics, and optomechanics. However, the removal of the growth substrate often leads to a rough membrane surface, which increases scattering losses in optical devices. In this work, we demonstrate membranes with etched surface roughness comparable to that of the as-grown epitaxial material, accomplished by the implementation of a properly designed built-in polarization field near the top of the sacrificial layer from an AlInN interlayer, which is polarization-mismatched to GaN. This leads to a steeper reduction in free carrier density during the electrochemical etching of the sacrificial layer, limiting the etching current and thus causing an abrupter etch stop. As a result, the root mean square roughness is reduced to 0.4 nm over 5 × 5 μm2. These smooth membranes open attractive pathways for the fabrication of high-quality optical cavities and waveguides operating in the ultraviolet and visible spectral regions.

Highlights

  • N requires a large number of pairs, which might be detrimental for practical use.6,7 The issues with heterogeneous epitaxy of III-Ns can be circumvented by lifting-off III-N membranes from the growth substrate and bonding them to the material of choice

  • We demonstrate membranes with etched surface roughness comparable to that of the as-grown epitaxial material, accomplished by the implementation of a properly designed built-in polarization field near the top of the sacrificial layer from an AlInN interlayer, which is polarization-mismatched to GaN

  • Only EC etching simultaneously allows for the fabrication of membranes with low dislocation density, precisely controlled thickness, smooth surfaces, and etching rates up to 1 lm/s, while being compatible with electrical contacts [the thermal decomposition of GaN is not, due to the high temperatures required, >1000 C (Ref. 8)]

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Summary

Introduction

N requires a large number of pairs, which might be detrimental for practical use.6,7 The issues with heterogeneous epitaxy of III-Ns can be circumvented by lifting-off III-N membranes from the growth substrate and bonding them to the material of choice. We demonstrate membranes with etched surface roughness comparable to that of the as-grown epitaxial material, accomplished by the implementation of a properly designed built-in polarization field near the top of the sacrificial layer from an AlInN interlayer, which is polarization-mismatched to GaN.

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