Abstract
A general trend in the field of industrial supported catalysts has been to increase the dispersion of the catalytically active phase(s). Most of these systems can be described as very small particles (size less than 3 nm, very often below 1 nm) supported on a high area support, i.e. on small particles (2–10 nm) of (refractory) oxides or carbon. Their characterization requires elemental, chemical and structural analyses with a high spatial resolution. The use of X-ray emission microanalysis, electron energy loss spectroscopy and microdiffraction available in a dedicated high resolution STEM are described in the case of metallic and non-metallic catalytic particles deposited on high area supports. The required improvements of such instruments are presented. The adequacy of analytical electron microscopy as compared to other global methods is discussed, especially with respect to the determination of the surface composition and structure and the chemical state of the active phases.
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