Abstract

The study focused on the measurements of depth dose for small beam in the high energy photons and electrons. The percentage depth dose (PDD) was measured in 6 and 10 MV photons and 9 and 12 MeV electrons at 3 × 3 cm field sizes by using the Al2O3 optically stimulated luminescent (OSL) dosimeters. The PDD in OSL dosimeters were compared to those in ionization chamber and Gafchromic EBT3 film dosimeter. The results showed that the PDD in OSL dosimeters in lower photon and electron energies were in good agreement within 4% to ionization chamber and film. The PDD in 10 MV photons however showed gradual increase of deviation up to 10% beyond the depth of maximum dose (dmax). The surface doses in OSL dosimeters were significantly higher compared to those in ionization chamber and film dosimeter. The overall results suggested the suitability of OSL dosimeters to be used as indirect dosimetry works in high energy photons and electrons.

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