Abstract

In the present investigation, titania thin films doped with varying concentrations of Samarium (Sm) were synthesized by spin coating method on glass substrate. The obtained films were annealed at two different temperatures (350 and 450 ֯C) to induce crystallinity. The structural property of these samples was characterized by using X-ray Diffraction (XRD) and Raman spectrometer. The surface morphology of the films was analysed by Field Emission Scanning Electron Microscopy (FESEM) and Atomic Force Microscopy (AFM). The presence of pure anatase phase with enhanced polycrystalline nature was evident for the films annealed at 350 and 450 ֯C. Due to the addition of Sm, the titania thin films exhibited increased crystallinity. The Raman analysis also support the presence of crystalline anatase phase and the existence of defects in the deposited films. The prepared samples were also subjected to photocatalytic activity studies by using methyl orange (MO) dye and the results are discussed herein. The rate constant increased and half life time decreased considerably for 0.4 at% doped samples. The current work provides new ideas for monitoring the structural properties by adding low concentration rare earth dopant into metal oxides (titania) suitable for various applications.

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