Abstract
Adhesion and friction forces between zinc oxide nanowires and silicon substrate were studied in situ inside a scanning electron microscope. A procedure for measuring these forces from the bending profiles of the nanowires was developed and the van der Waals and friction forces were found to be about 81.05pN and 7.7nN, respectively. The pronounced friction was explained using nanoscale adhesion-friction coupling mechanisms. Immediate implication of the findings is on the accuracy of nanomechanical characterization using bending experiments.
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