Abstract
Granular composite films based on BaB 6 –LaB 6 , Sn 0.9 Sb 0.1 O 2 , and alumina borosilicate glass produced by screen-printing followed by heat treatment are studied. To find the thicknesses of nanosized dielectric layers between the conducting particles, predetermining the conductivity mechanism and film properties, a novel calculation method is used. To evaluate the reliability of the results, film structures are studied by atomic force microscopy. The calculated data are in good agreement with the experiment. The method may be applied in examining the structure and properties of new conductor–dielectric composites.
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