Abstract
The electrical resistivity of thin films of topological insulator (TI) Bi2Se3 10 to 75 nm thick is measured in the temperature range of 4.2 to 300 K. A size effect is observed in the electrical conductivity of the Bi2Se3 films; i.e., there is a linear dependence of a film’s conductivity on its inverse thickness. It is assumed that a similar effect can be observed in other TIs and in systems with nonuniform distributions of current over the cross section of a sample.
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