Abstract
Optical contrast from InN nanodots grown on nitrided sapphire is investigated using apertureless near-field scanning optical microscopy at two different visible wavelengths, 633 nm and 532 nm. The dependence of the near-field signal on the size of the dots is described using a coupled dipole model expanded to four dipoles. The near-field signal from InN dots with a height of <1 nm is detected due to dipole–dipole coupling.
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