Abstract
A method for reproducible site-specific force spectroscopic measurements at room temperature by combining frequency modulation atomic force microscopy and the atom tracking technique is proposed. The atom tracking enables to compensate the change in the tip-sample relative position due to the thermal drift as well as to precise positioning of the AFM tip over the same spot of the surface within sub-angstrom stability. This allows us to perform site-specific force spectroscopic measurements even at room temperature. The method has been tested in performing spectroscopic measurements on atomic positions of the Si(111)-(7×7) surface.
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