Abstract
Site modification in BiFeO3 films was investigated using Raman spectroscopy and piezoelectric force microscopy to explore effect of A- and B-site modifications on structural evolution and ferroelectric behavior of doped BiFeO3 films. Our Raman results revealed the subtle structural changes in the BiFeO3 films caused by the changes of the short-range force in the crystal lattice induced by ionic radii mismatch. The observation of ferroelectric domain and the control of domain switching through an electric field in these doped BiFeO3 films were realized by piezoelectric force microscopy. Piezoelectric response of these doped BiFeO3 films illustrated dependence of their properties upon the lattice symmetry and film microstructure.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
