Abstract
The single-slit diffraction patterns of monochromatic X-rays of wavelengths 0.16 nm and 0.1 nm have been recorded on a large linear scale by using a long distance, 16 m, between slit and photographic plate. The spacings of subsidiary maxima ranged from 0.1 mm to 0.6 mm, depending upon the width of the slit. Applications of such diffraction patterns in illumination systems for X-ray phase contrast microscopy and interferometry are envisaged.
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