Abstract

We introduce a diagnostic for measuring the transverse phase space (TPS) and transverse second moments of a particle beam in a single shot. The diagnostic consists of a slit followed by a simple projection beam line to project the TPS onto an imaging screen. The beam line is composed of a skew quadrupole magnet followed by a normal quadrupole magnet with an imaging screen at the end. The skew quadrupole generates a coupling between the initial $x$ and the final $y$, while the normal quadrupole removes the correlation between the initial $x$ and the initial ${x}^{\ensuremath{'}}$. Thus, the initial $(x,{x}^{\ensuremath{'}})$ is mapped onto the final $(x,y)$. The slit is needed before the projection beam line to remove the initial $(y,{y}^{\ensuremath{'}})$ contribution from the final $(x,y)$ image on the screen. We present simulation studies and a demonstration of the diagnostic with an experiment performed at Argonne Wakefield Accelerator facility. We also discuss the method's limitations.

Highlights

  • The characterization of high-brightness beams is a key factor in optimizing accelerator performance in applications ranging from ion implantation to electron-based x-ray free electron lasers [1,2,3,4]

  • We introduce a single-shot diagnostic for measuring the transverse phase space (TPS) by projecting the initial horizontal phase space ðx0; x00Þ onto a final ðxf; yfÞ imaging screen

  • We start with the principle of the projection beam line and discuss the limitations arising from the use of a slit, such as systematic measurement errors due to the difference between the second moments of the single slice and entire beam and the potential errors due to the final reconstruction process for multiple slices

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Summary

INTRODUCTION

The characterization of high-brightness beams is a key factor in optimizing accelerator performance in applications ranging from ion implantation to electron-based x-ray free electron lasers [1,2,3,4]. We start with the principle of the projection beam line and discuss the limitations arising from the use of a slit, such as systematic measurement errors due to the difference between the second moments of the single slice and entire beam and the potential errors due to the final reconstruction process for multiple slices. These limitations depend on the actual condition of the incident beam. V, we conclude by considering applications of the projection-based diagnostic

PROJECTION OF TRANSVERSE PHASE SPACE
Projection beam line
CCCA: ð1Þ y02
Errors in the projection
Experimental verification of projection
MEASUREMENT WITH SINGLE SLICING
MEASUREMENT WITH MULTISLICING
Separation of projected images
Number of slits and separation
Limitation of the method
Online optimization
APPLICATIONS OF THE PROJECTION METHOD
Jitter and quality degradation source detection with big data
Single-shot measurement of the longitudinal slice’s TPS
Findings
CONCLUSION
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