Abstract
We introduce a diagnostic for measuring the transverse phase space (TPS) and transverse second moments of a particle beam in a single shot. The diagnostic consists of a slit followed by a simple projection beam line to project the TPS onto an imaging screen. The beam line is composed of a skew quadrupole magnet followed by a normal quadrupole magnet with an imaging screen at the end. The skew quadrupole generates a coupling between the initial $x$ and the final $y$, while the normal quadrupole removes the correlation between the initial $x$ and the initial ${x}^{\ensuremath{'}}$. Thus, the initial $(x,{x}^{\ensuremath{'}})$ is mapped onto the final $(x,y)$. The slit is needed before the projection beam line to remove the initial $(y,{y}^{\ensuremath{'}})$ contribution from the final $(x,y)$ image on the screen. We present simulation studies and a demonstration of the diagnostic with an experiment performed at Argonne Wakefield Accelerator facility. We also discuss the method's limitations.
Highlights
The characterization of high-brightness beams is a key factor in optimizing accelerator performance in applications ranging from ion implantation to electron-based x-ray free electron lasers [1,2,3,4]
We introduce a single-shot diagnostic for measuring the transverse phase space (TPS) by projecting the initial horizontal phase space ðx0; x00Þ onto a final ðxf; yfÞ imaging screen
We start with the principle of the projection beam line and discuss the limitations arising from the use of a slit, such as systematic measurement errors due to the difference between the second moments of the single slice and entire beam and the potential errors due to the final reconstruction process for multiple slices
Summary
The characterization of high-brightness beams is a key factor in optimizing accelerator performance in applications ranging from ion implantation to electron-based x-ray free electron lasers [1,2,3,4]. We start with the principle of the projection beam line and discuss the limitations arising from the use of a slit, such as systematic measurement errors due to the difference between the second moments of the single slice and entire beam and the potential errors due to the final reconstruction process for multiple slices. These limitations depend on the actual condition of the incident beam. V, we conclude by considering applications of the projection-based diagnostic
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