Abstract
Characterization and control of the transverse phase space of high-brightness electron beams is required at free-electron lasers or electron diffraction experiments for emittance measurement and beam optimization as well as at advanced acceleration experiments. Dielectric laser accelerators or plasma accelerators with external injection indeed require beam sizes at the micron level and below. We present a method using nano-fabricated metallic wires oriented at different angles to obtain projections of the transverse phase space by scanning the wires through the beam and detecting the amount of scattered particles. Performing this measurement at several locations along the waist allows assessing the transverse distribution at different phase advances. By applying a novel tomographic algorithm the transverse phase space density can be reconstructed. Measurements at the ACHIP chamber at SwissFEL confirm that the transverse phase space of micrometer-sized electron beams can be reliably characterized using this method.
Highlights
High-gradient advanced accelerator concepts including plasma and dielectric structure based schemes are developed at various laboratories for future compact accelerators.The wavelength of the accelerating field in a plasma accelerator is given by the plasma wavelength which is typically on the order of tens of micrometers [1]
Characterization and control of the transverse phase space of high-brightness electron beams is required at free-electron lasers or electron diffraction experiments for emittance measurement and beam optimization as well as at advanced acceleration experiments
We have measured projections of the transverse electron beam profile at the ACHIP chamber at SwissFEL with the accelerator setup, wire scanner and beam loss monitor (BLM) detector described in Sec
Summary
High-gradient advanced accelerator concepts including plasma and dielectric structure based schemes are developed at various laboratories for future compact accelerators. The wavelength of the accelerating field in a plasma accelerator is given by the plasma wavelength which is typically on the order of tens of micrometers [1]. A dielectric laser accelerator (DLA) is operating in the optical to near-infrared spectrum leading to structure apertures on the order of a single micrometer [2]. Suitable test beams for external injection have to be generated and characterized down to the submicrometer level. Future compact free-electron laser facilities operating at small normalized emittances on the order of 50 nm rad [3] require profile monitors with micrometer resolution. Electron diffraction requires an even smaller emittance to achieve the required coherence [4]
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