Abstract
High speed piezoforce microscopy (HSPFM) is a versatile technique for directly monitoring ferroelectric domain switching with nanoscale resolution. For a single region in a PbZr0.2Ti0.8O3 thin film, HSPFM movies are presented at two distinct poling potentials, collectively acquired in less than the time necessary for just a single conventional PFM image. The number of nucleation sites resolved per area is greater for the stronger switching field, while the switching pattern is visibly similar. Focusing on a single domain site, nucleation clearly occurs much more rapidly for the stronger field. Domain growth rates are also quantified for this individual feature and found to increase by a factor of 2 when the dc poling potential is adjusted from negative 1.7 to negative 1.9V.
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Schedule a callMore From: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
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