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https://doi.org/10.1109/tns.2013.2290753
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Cite Journal: IEEE Transactions on Nuclear Science |  Publication Date: Dec 1, 2013 |
 Citations: 2 |
Affiliation: Goddard Space Flight Center
We apply a model and heavy-ion cross section data to predict the potential that one single event upset (SEU) will induce multiple bit errors (MBEs) by the next clock-cycle of a synchronous design.
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