Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions

Abstract

This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 field programmable gate array (FPGA) and presents an in-depth analysis of the SEE susceptibility of all the memories of the programmable logic. The radiation experiments were performed in the CERN North Area facility and in the GSI Helmholtz Centre for Heavy Ion Research using very/ultra high-energy heavy ions. The offline analysis of the radiation experimental results produced a deep understanding for various SEE phenomena observed in the Zynq-7000 FPGAs, such as single-event function interrupts (SEFIs), single-event transient (SET) in global signals, and multiple bit upsets that could be key issues for the design of an effective SEE mitigation approach.