Abstract
To investigate the origin of the enhanced Tc (≈ 110K) of the trilayer cuprate superconductor Bi2Sr2Ca2Cu3O10+δ (Bi-2223), its underdoped single crystals are a critical requirement. Here, we demonstrate the first successful in-plane resistivity measurements of heavily underdoped Bi-2223 (zero-resistivity temperatures ≈ 20∼35K). Detailed crystal growth methods, the annealing process, as well as X-ray diffraction (XRD) and magnetic susceptibility measurement results are also reported.
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