Abstract

Reliability tests are always conducted to evaluate and improve the reliability of critical engineering equipment. Considering that the one hundred percent inspection is too expensive and time-consuming, an effective sampling plan is required to assess the reliability of engineering products. Generally, a product usually has more than one quality characteristic, and sometimes it is necessary to classify both the product and the lot into multiple classes. However, in the previous research, very few scholars have considered the multi-attribute multi-category products and multi-class lot simultaneously. This paper aims to fill in this gap by proposing single and sequential sampling plans for multi-attribute products and multi-class lot. Specifically, in the case of two-attribute three-category products and three-class lot, a single sampling plan and a sequential sampling plan are presented, respectively. The extended operating characteristic functions are derived by using the finite Markov chain imbedding approach. Two designing methods are proposed and the corresponding optimization models are constructed for each sampling plan by analyzing the operating characteristic surfaces.

Highlights

  • The reliability test is an important tool to assess the reliability of critical engineering systems and components in many fields, including aeronautical engineering, military engineering and mechanical engineering

  • This paper proposes the multi-attribute single and sequential sampling plans for multi-class lot

  • finite Markov chain imbedding approach (FMCIA) was first proposed by [28] and has significant applications in many research areas, such as start-up demonstration tests [29], reliability analysis [30]–[32], and acceptance sampling plans [20]. Such multi-attribute sampling plans for multi-class lot are motivated by the reliability tests of transistors

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Summary

INTRODUCTION

The reliability test is an important tool to assess the reliability of critical engineering systems and components in many fields, including aeronautical engineering, military engineering and mechanical engineering. In previous literature, very few studies have simultaneously considered the multi-attribute multi-category products and multi-class lot To address this gap, this paper proposes the multi-attribute single and sequential sampling plans for multi-class lot. The case of three-class lot and two-attribute products is presented to illustrate the proposed sampling plans Both of the single and sequential sampling plans involve two product attributes, which are assumed to be independent from each other. FMCIA was first proposed by [28] and has significant applications in many research areas, such as start-up demonstration tests [29], reliability analysis [30]–[32], and acceptance sampling plans [20] Such multi-attribute sampling plans for multi-class lot are motivated by the reliability tests of transistors.

OVERVIEW OF THE TWO SAMPLING PLANS
VIII. CONCLUSIONS
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