Simultaneous thickness and group index measurement with a single arm low-coherence interferometer.

Abstract

We present a single arm low-coherence interferometer to directly measure the physical thickness and group refractive index of optically transparent samples having flat and parallel surfaces. The optical arrangement, resembling a common-path interferometer, is more compact and stable than the usual dual-arm low-coherence interferometer. It has been used to measure samples of Herasil 102 fused silica, Schott B270 Superwhite crown glass and borosilicate cover glass. The results obtained indicate uncertainties in the third decimal place for index values and thicknesses accurate to within 2 μm.