Abstract
Combined atomic force-scanning electrochemical microscopy (AFM-SECM) has been explored for monitoring copper ions generated by dissolution of copper samples while recording induced changes in topography. Released Cu2+ ions were detected via reduction to metallic copper at the AFM tip-integrated electrode followed by subsequent re-dissolution in bulk solution by anodic stripping voltammetry. Copper crystals electrodeposited on gold substrates were used as model systems to demonstrate the laterally resolved analysis of topographical changes and the simultaneous measurement of localized cation release, which was anodically activated upon exposure to acidified chloride-containing solution. Finally, the potential of AFM-SECM for monitoring spatially resolved corrosion processes with sub-micrometer resolution was illustrated using a pure copper sample.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
