Abstract

Single event transient effect in LM124 Operational Amplifier is investigated in this paper by computer simulations. Circuit level simulations are performed to analyze the output response of a voltage follower which consists of LM124 Operational Amplifier under single event transients (SETs). Simulation results show that different output responses were shown in different parts under the radiation. Furthermore, the most sensitive parts under the SETs are found. Simulations results above are helpful for further harden designs of linear ICs.

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