Abstract
Using 3-D technology computer-aided design numerical simulation, we comprehensively analyze the impact of node-state transition on a single-event transient (SET) pulse. Simulation results present that the SET pulsewidth is a function of the node current state and the state transition time. Based on the simulation results, we quantize the difference between the static SET injection and the dynamic SET injection.
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More From: IEEE Transactions on Device and Materials Reliability
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