Abstract
The extended fine structure of K-edges ranging from AlK to CrK in metals (Al, Ti, V, Cr) and binary intermetallic compounds (TiAl) has been recorded by X-ray absorption spectrometry (XAS) and/or electron energy-loss spectrometry (EELS). It is found that EEL spectrometry can be used reliably up to energy losses of 7 keV which have generally not been considered with this technique. Simulation of the experimental data have been performed through the so-called standard EXAFS method and using the “ab-initio” code FEFF which allows a high-order multiple scattering calculation.
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