Simulation of the critical current density and its dependence on geometrical factors inRABiTS based coated conductors

Abstract

The conductor width dependence of the critical current densityJc in the grain boundary network occurring in RABiTS based coated conductors is simulatedusing experimentally obtained electron backscattering diffraction (EBSD) maps and theexponential dependence of the critical current density on the misorientation angle. It isfound that a conductor width of around 20 grains (of average size) is sufficient to pass 90%of the maximum current density, independent of texture quality and grain aspect ratio inthe current direction. The aspect ratio does however influence the absolute value ofJc, givinghigher Jc values for higher aspect ratios. These results are in good agreement withJc simulations based on purely statistical grain boundary distributions.