Simulation and experimental analysis of tip response of tapping mode atomic force microscope

Anjie Peng,Zheng Wei,Yaxin Chen,Rui Guan

doi:10.21595/vp.2022.22341

Anjie Peng, Zheng Wei + Show 2 more

Open Access

https://doi.org/10.21595/vp.2022.22341

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Abstract

In this study, the vertical deflection responses of tapping mode atomic force microscope (TM-AFM) micro-cantilever tip are obtained by simulation and experiment. The results show that, under the blocking of the sample on one side, the steady-state response of the tip is still a sinusoidal form almost symmetrical about the equilibrium position. Furthermore, from the perspective of energy dissipation of the micro-cantilever system, the phases of two surfaces with different properties are simulated under different background dissipation. The result shows that eliminating partial background dissipation can increase the phase contrast between the two surfaces. These results are of significance for understanding the tip response and phase optimization in TM-AFM.

Highlights

Since the emergence of atomic force microscopes (AFM), it has become one of the most powerful tools in micro- and nanotechnology because of its excellent resolution [1, 2]
In order to simulate the response of the tip in tapping mode atomic force microscope (TM-AFM), the parameters of the real micro cantilever are used
The displacement response of the tip in tapping mode is obtained by simulation and experiment

Summary

Introduction

Since the emergence of atomic force microscopes (AFM), it has become one of the most powerful tools in micro- and nanotechnology because of its excellent resolution [1, 2]. Tapping mode (TM) is one of the most commonly used operation modes in atomic force microscopes It can obtain high-resolution images of various information of samples, and can greatly reduce the wear of the tip and damages to the sample compared with contact mode [3]. Tapping mode atomic force microscope (TM-AFM) is widely used in various fields, including biomolecules, polymers, and nanostructures [4,5,6,7]. Few studies have optimized the phase contrast in TM-AFM from the perspective of reducing the background dissipation of the micro-cantilever system. SIMULATION AND EXPERIMENTAL ANALYSIS OF TIP RESPONSE OF TAPPING MODE ATOMIC FORCE MICROSCOPE. The time history response of the tip displacement is obtained by numerical simulation and experiment. From the perspective of energy dissipation, the phases of the tip working on two surfaces with different properties under different background dissipation is simulated, and the factors affecting the phase contrast between the two surfaces are analyzed

Analysis of tip response in TM-AFM

Analysis of time history response of the tip displacement

Influence of background dissipation on phase contrast in TM-AFM

Conclusions