Abstract
A magnetic microdeflector was developed for the electron beam microcolumn system to control the electron beam deflection/scanning. The magnetic microdeflector fabricated by the microelectromechanical system technology consists of four magnetic poles coupled with solenoid-type micromachined inductors with NiFe permalloy magnetic cores. The four magnetic poles are divided into two pairs which control the electron beam deflection/scanning in X and Y axes, respectively. Experimental results show that the electron beam deflection increases linearly to 210μm with a driving current of 50mA and an electrical power consumption of 3mW. The fabricated magnetic microdeflector has a good dynamic property, as shown by the rise time of 25ns with respect to a 50mA step signal. The developed magnetic deflector demonstrates excellent performance in controlling the electron beam deflection/scanning for the electron beam microcolumn system.
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