Simulating the fine structure in HRTEM images of defects

Abstract

The macroscopic properties of materials are often determined by the atomic structure of crystalline defects. High resolution transmission electron microscopy (HRTEM) enables the study of internal defects on the atomic scale. Image simulations represent an essential step in these studies since it is generally not possible to deduce the atomic positions near defects directly from the image intensities. Fortunately, image simulations which employ the multislice method and incorporate image formation theory for partially coherent illumination offer an accurate means of simulating images. With the availability of faster computers with larger memory capacity, the routine calulation of images of aperiodic defects is now feasible. This discussion will focus on the use of image simulations to extract structural information at defects, and to account for the artifacts which are frequently encountered in these studies.