Simulated Annealing with Partial Evaluation of Objective Function Applied to Electrical Impedance Tomography

Abstract

AbstractElectrical Impedance Tomography (EIT) is a imaging technique that attempts to reconstruct the conductivity distribution inside an object from electrical currents and potentials measured at its surface. The EIT reconstruction problem can be approached as an optimization problem where one tries to maximize the matching between a simulated impedance domain and the observed one. This optimization problem may be approached by Simulated Annealing (SA), but at a large computational cost due to the expensive evaluation process of the objective function. We propose here a variation of SA applied to EIT where the objective function is evaluated only partially, while ensuring upper boundaries on the deviation on the behavior of the modified SA. Copyright © 2011 IFAC.