Abstract
The addition of MgO to α-Al2O3 has been practiced for over 30 years in order to improve greatly the properties of the sintered material. However, a complete understanding of the role of MgO has not been achieved despite significant research efforts by various groups. The most difficult obstacle is microchemical characterization of MgO doped Al2O3. Surface analytical techniques, primarily AES and XPS, have been employed by past researchers in order to analyze the grain boundaries on fractured surfaces of sintered Al2O3. This prior work has met with limited success due to poor sensitivity and spatial resolution. MgO is believed to segregate to the grain boundaries and to retard the grain boundary mobility via a solute drag mechanism; this hypothesis has not been verified experimentally.In this study, the distribution of Ca and Mg was characterized by a high lateral resolution scanning ion microprobe (SIM) developed at The University of Chicago (UC).
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