Abstract
The migration of implanted 9Be in (100) semi‐insulating during thermal annealing has been studied using secondary ion mass spectrometry. Under typical annealing conditions for (, ) we have observed that implanted 9Be is a rapid diffusant in semi‐insulating for fluences as low as . Redistribution of the compensating impurity (Fe or Cr) has also been observed. In several respects Cr redistribution differs from that of Fe. Twin‐peaked structures appear in the impurity profiles of 550°C anneals of 100 keV, 1015 cm−29Be implanted materials. Models for this phenomenon are discussed. Correlations are noted between 9Be and compensating impurity profiles in annealed, high fluence implanted samples. Flat tails of 9Be extending over several microns are observed in semi‐insulating .
Published Version
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