Abstract
Photo-thermal radiometry (PTR) technique in frequency domain is well known as an effective mean of non-destructive infrared detection. Conventional PTR technique is developed for thermal diffusivity determinations of thin metal layers. In this paper, a simplified transmission PTR technique for accurate thermal diffusivity measurement of thin metal layer is presented. The thermal diffusivity of Cu (10μm) and Al (27μm) determined by the simplified transmission PTR system is 83.13mm2/s and 78.02mm2/s, respectively. The goodness of fit analysis shows that the simplified transmission PTR system has high reliability and accuracy.
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