Abstract
Transistors in three-phase voltage-source inverter often suffer from open-circuit failures due to the lifting of bonding wires caused by thermic cycling, resulting in performance degradation with ripple torque and current harmonics. Current-spectral-analysis based methods are widely applied to failure diagnosis; however, high calculation consumption and complex implementation limit their application in some real-time occasion. In this paper, a simplified Fourier series method is proposed by the product between reconstructed phase currents and reference signals. Meanwhile, a novel normalized method for DC and fundamental components of simplified Fourier series are proposed to locate twenty-one transistor open-circuit faults. Numerical results show that the proposed Fourier series method coincides with that of Fast Fourier Transform. Experimental results and the comparison with previous methods show high efficiency and merits of its application to transistor open-circuit fault location in the voltage-source inverter.
Highlights
Three-phase VSIs are widely used in industrial applications due to their superior performance
SIMPLIFIED FOURIER SERIES IN VSI FED IM The structure of three-phase VSI fed IM is showed in Fig. 1, Ud is the input voltage of the drive system, C1, C2 are two symmetrical capacitors to eliminate high frequently harmonics of the supply voltage
This paper focuses on transistor opencircuit fault location in VSI fed IM with FOC
Summary
Three-phase VSIs are widely used in industrial applications due to their superior performance. The reported fault diagnosis methods in three-phase VSIs include two kinds: signal of component-based and signal of system-based The former one uses the internal signal as diagnostic features by failure mechanism in the physical and electrical model of power component, such as collectorto-emitter voltage, the drain-to-source voltage, and gate-tosource voltage during the IGBT turn-on transient are used for healthy condition [8], [9]. Current-based diagnostic methods in abc-axis are the most widely researched, normalized DC current and its modified method are proposed in [19], [20] They have some drawbacks when implemented in a closed-loop scheme and poor robustness to transients. 2) Novel normalized method for DC and fundamental components by simplified Fourier series are proposed to locate twenty-one transistor open-circuit, experimental results show high efficiency and merits.
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