Abstract
A simple approximation of EHD film thickness under varying speed conditions is proposed. The equation is based on continuity of flow, by which the film formed at the contact inlet moves downstream within the contact with little subsequent change in its thickness even though the boundary velocities are changing. The approximation is supported by experimental results of non-steady state film thickness measurement using ultra-thin film interferometry. It is also shown by numerical simulation that the approximation holds for film thickness in the rigid piezoviscous regime under line contact so long as the squeeze film effect is insignificant.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
