Abstract

This paper presents a working numerical algorithm for characterizing a wide variety of interconnect configurations used in monolithic microwave integrated circuits (MMICs). The problem is formulated using free space Green's function with equivalent charges on material interfaces. The resulting integral equations are solved by the method of moments (MOM). To facilitate solving the problems, a mesh generator computer program that ‘reads’ the geometry and prepares necessary data files has been written. Various applications are considered such as buried microstrip lines, microstrips with inhomogeneous substrates and microstrips with proximity effects. Computed results compare well to measurements and other published data.

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