Abstract
In article number 2000838, Mi-Jeong Kim, Hiesang Sohn, and co-workers present crystallized Ag nanowires film (c-Ag NWs), prepared through solution annealing (70 °C) for flexible electronic devices. The c-Ag NWs film shows excellent mechano-electric stability (resistance change, ΔR/ΔRo: 45%) after 200 000 bending cycles under strain of 6.7%. Additionally, c-Ag NWs based patterned electrode demonstrates the comparable electrical property (9.41 kΩ) to that of ITO-based one (8.01 kΩ).
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