Abstract
The motivation for his book stems from the complexity of on-wafer measurements and their associated characterization techniques. His intent is to bridge the gap between academic knowledge and real-world silicon design and measurement and also to satisfy the needs of modern RF integrated circuit designers and researchers. Dr. Lourandakis provides a complete and comprehensive guide to performing on-wafer measurements, calibration, and de-embedding of silicon-integrated passive devices. The book opens with an introduction to two basic domains of signal analysis: frequency- and time-domain analysis.
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