Abstract
The focus of his book is the complex subject of on-wafer measurements and their associated characterization techniques. The author aims to bridge the gap between academic knowledge and real-world silicon design and measurement and thus satisfy the needs of modern-day RF integrated circuit designers and researchers. His purpose is to provide a complete and comprehensive guide for performing on-wafer measurements, calibration, and de-embedding of silicon-integrated passive devices. This book starts with the introduction of two basic domains of signal analysis: frequency- and time-domain analysis. The author indicates that LRRM calibration is more robust and its coverage is better in terms of the theoretical value over a broader frequency range.
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