Abstract
A heavy metal-free chalcopyrite (Cu2MnSnS4) thin film has been synthesized via the SILAR method by varying the adsorption and reaction time. The fabricated thin films are characterized by structural, spectral, and optical properties that are analyzed. The X-ray diffraction studies indicated the formation of Cu2MnSnS4 with grain size ranging from (16–18 nm). The Field Emission Scanning Electron Microscopic (FESEM) analysis revealed uniform film formation. Fourier Transformed Infrared Spectral (FTIR) analysis shows that sharp peaks are observed at 552 cm−1 and 1248 cm−1, indicating the presence of metal-sulfur bonds. The peak at 810 cm−1 is due to the resonance interaction of the sulfide ion. The band gap of Cu2MnSnS4 is in the range of 1.96–2.01 eV from UV–visible absorption studies.
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